91无码,国产成人偷一区二区,国产午夜永久网站,五月天久久久噜噜噜久久
首頁
關(guān)于天儀
產(chǎn)品中心
應(yīng)用方案
綜合服務(wù)
資料下載
聯(lián)系我們
產(chǎn)品搜索
teset2
產(chǎn)品分類
Keithley
美國泰克Tektronix
TDK電源
Sinolink
優(yōu)利德
山東博納電氣
日本加野麥克斯環(huán)境測(cè)試儀器
SZL致遠(yuǎn)電子
臺(tái)灣衡欣
siglent
FLUKE NMPP 產(chǎn)品
KEYSIGHT
勝利儀器
Chroma
清華科技
日置儀器
橫河儀器
吹田電氣
固緯儀器(GW INSTEK)
優(yōu)益速環(huán)境儀器
產(chǎn)品資料
首頁
>>>
產(chǎn)品目錄
>>>
Chroma
>>> 
PXI 量測(cè)解決方案
PXIe Programmable Device Power Supply
點(diǎn)擊看大圖
如果您對(duì)該產(chǎn)品感興趣的話,可以
產(chǎn)品名稱:
PXIe Programmable Device Power Supply
產(chǎn)品型號(hào):
33020
產(chǎn)品展商:
Chroma
產(chǎn)品文檔:
無相關(guān)文檔
簡單介紹
High channel density with 8 channels per card -6V~12V independently programmable voltage level Max. 250mA (500mA at 6V) current per channel Parallel current gang feature providing max. 4A output per card 16-bit voltage programming resolution 18-bit measurement resolution with accuracy up to 0.01% Very fast settling time for best throughput Programmable voltage and current protection clampin
PXIe Programmable Device Power Supply
的詳細(xì)介紹
產(chǎn)品特色
High channel density with 8 channels per card
-6V~12V independently programmable voltage level
Max. 250mA (500mA at 6V) current per channel
Parallel current gang feature providing max. 4A output per card
16-bit voltage programming resolution
18-bit measurement resolution with accuracy up to 0.01%
Very fast settling time for best throughput
Programmable voltage and current protection clamping
External trigger input and output for high speed test synchronization
Semiconductor grade CRAFT-PXIe software
LabView and LabWindows support
Master/Slave architecture for boards chaining
Compliance pattern and timing structure with Chroma 3380 series
Focused Applications
MCU and consumer SoC
MEMS & Sensors: Light sensors, Temperature sensors, Pressure sensor, Magnetic sensors, Gyro, Accelerometers
Automotive 48V Power Systems
RF: Switch/Front-end module IC, Connectivity (Bluetooth, WiFi, Combo, etc.), Mobile IC
The world is pushed to change by the advance in semiconductor technologies. This is the time when artificial intelligence meets 5G, when autonomous cars meets big data analysis, with everything consolidated into a portable device. Semiconductor test systems need to be transformed to a new era where all sorts of features needs to be integrated into a tiny system. The emerging PXIe based platform provides a good viable path to fulfill the needs in the new era. Chroma's PXIe Semiconductor Test Solutions give our clients a versatile workplace to complete the semiconductor test while integrating functional instrument modules from different suppliers.
Semiconductor Test Class Device Power Supplies without Compromise
Chroma 33020 PXIe based programmable power supply card is a highly integrated power supply module that comes with everything you need for semiconductor test. It has the highest density of 8 independently programmable DC voltages from -6V to 12V at 250mA or 6V at 500mA with programmable voltage and current clamping. The outputs can be ganged together with output current up to 4A. For semiconductor test applications, those device power supplies also come with 16-bit force voltages levels and 18-bit measurement voltage resolution at 500ksps sampling rate that provides superior accuracy. Device set up time is also greatly improved with a settling time from 50uS to 500uS to achieve the highest test speed needed.
Proprietary Software, CRAFT and Other Rich Features of Software Support
In addition to supporting the LabView and LabWindows environment, Chroma provides a proprietary software suite, CRAFT. CRAFT, running on Microsoft Windows operation system, contains the full set of tools for semiconductor test from test program development, debugging, production and maintenance. The production tools include easy-of-use GUI software such as Operator Interface, Test data output, Binning and Sequence Control, Wafer Map, Summary Tool, and rich sets prober/handler drivers. The user debugging tools includes the Datalog, Plan Debug, TCM, Shmoo, Pattern Editor, Waveform, etc. It also supports LabView and LabWindow environment and a subset of debugging tools are provided. In addition, a third party CAD to ATE pattern conversion tool is also supported to cover the WGL/STIL/VCD/EVCD conversions.
產(chǎn)品留言
標(biāo)題
聯(lián)系人
聯(lián)系電話
內(nèi)容
驗(yàn)證碼
點(diǎn)擊換一張
注:1.可以使用快捷鍵Alt+S或Ctrl+Enter發(fā)送信息!
2.如有必要,請(qǐng)您留下您的詳細(xì)聯(lián)系方式!
相關(guān)產(chǎn)品
電源供應(yīng)模組 52310e Series
高精準(zhǔn)電源量測(cè)單元 52400 Series
高精準(zhǔn)電源量測(cè)單元 52401-25-200m
高精準(zhǔn)電源量測(cè)單元 52405-5-3
高精準(zhǔn)電源量測(cè)單元 52405-10-2
Copyright@ 2003-2025
蘇州天儀科創(chuàng)機(jī)電科技有限公司
版權(quán)所有
電話:13812681512
傳真:0512-65569519
地址:蘇州市吳中區(qū)橫涇東林渡巷98號(hào)
郵編:215003
蘇ICP備09033842號(hào)-3
蘇公網(wǎng)安備 32050802010778號(hào)