Addressing the Testing Needs for All Types of Semiconductor Components
The world is pushed to change by the advance in semiconductor technologies. This is the time when artificial intelligence meets 5G, when autonomous cars meets big data analysis, with everything consolidated into a portable device. Semiconductor test systems need to be transformed to a new era where all sorts of features needs to be integrated into a tiny system. The emerging PXIe based platform provides a good viable path to fulfill the needs in the new era. Chroma's PXIe Semiconductor Test Solutions give our clients a versatile workplace to complete the semiconductor test while integrating functional instrument modules from different suppliers.
The First PXIe Card for All You Need Around Load Board Electronics
Load Boards are the most important interfacing electronics in semiconductor test systems. For all different kinds of needs in applications, a wide range of components might be added to the load board to maybe light up a power LED, simulate the actual application environment, multiplex for cost considerations, or even recording the outputs from the device for data-logging purposes. Chroma 33011 Universal Relay Control card gives you everything that can be implemented on the load board with control - relays, sets of DC sources, SPI channels, and triggering signals. Users won't need to buy multiple PXIe cards nor occupying scarce test resources just to manage the needs on the load board. It saves PXIe slots for more - such as higher site count for more outputs.
Proprietary Software, CRAFT and Other Rich Features of Software Support
In addition to supporting the LabView and LabWindows environment, Chroma provides a proprietary software suite, CRAFT. CRAFT, running on Microsoft Windows operation system, contains the full set of tools for semiconductor test from test program development, debugging, production and maintenance. The production tools include easy-of-use GUI software such as Operator Interface, Test data output, Binning and Sequence Control, Wafer Map, Summary Tool, and rich sets prober/handler drivers. The user debugging tools includes the Datalog, Plan Debug, TCM, Shmoo, Pattern Editor, Waveform, etc. It also supports LabView and LabWindow environment and a subset of debugging tools are provided. In addition, a third party CAD to ATE pattern conversion tool is also supported to cover the WGL/STIL/VCD/EVCD conversions.
